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4/18/12 Disclosure of Equity Participations Pursuant to the Swiss Stock Exchange Act
3/8/11 INFICON Publishes Annual Report 2010
5/10/10 INFICON Holding AG Reports on Successful AGM
10/5/09 INFICON Introduces CMS5000 Monitoring System For Unattended, On-Site Voc Monitoring Of Water Or Air
7/21/09 INFICON Reports Sequentially Stable Sales in Second Quarter 2009
6/2/09 INFICON Digital Capacitance Diaphragm Gauges Offer Longer Life, Excellent Reproducibility and Repeatability
11/18/08 INFICON Announces Enhanced Support for FDC With Release of FabGuard 8.0
7/8/08 INFICON Introduces Guardian Co-Deposition Controller at Intersolar North America 2008
7/8/08 INFICON Introduces Transpector XPR3L Gas Analysis System at Intersolar North America 2008
4/2/08 INFICON to Announce First Quarter 2008 Results on Wednesday, April 16, 2008
1/10/08 INFICON Announces Date of Fourth Quarter and Full-Year 2007 Results
8/21/07 INFICON New Series of Digital Capacitance Diaphragm Gauges Offer Longer Life, Excellent Reproducibility and Repeatability
7/9/07 INFICON Introduces FabGuard FDC for Fabwide Fault Detection and Classification
6/8/07 INFICON Introduces the Only Ultra-fast, Ultra-small Plasma Arc Detector
10/30/06 Burghard Promoted to INFICON Semiconductor Segment Manager
7/28/06 INFICON Receives R&D 100 Award for Protec P3000 Helium Leak Detector
7/17/06 INFICON Introduces New Series Of Capacitance Diaphragm Gauges For Economical, Highly Accurate Pressure Measurement
7/17/06 INFICON Introduces the TC1000 Test Chamber For Automatic, Reliable Leak Testing of Airtight Packaging
12/6/05 INFICON Introduces New Series of Capacitance Diaphragm Gauges for Economical, Highly Accurate Pressure Measurement
9/22/05 Hot Ion Combination Gauge Measures 13 Decades With One Vacuum Connection and Automatic Self-calibrating Replacement Sensor
9/21/05 Semiconductor International Magazine Features INFICON - In Situ Particle Detection for Pre-Metal Sputter Etch
9/20/05 Bayard-Alpert/Pirani Gauge All in One - Measures 13 Decades With One Vacuum Connection
9/20/05 RF Sensor with FabGuard® Integration Software Provides Real-time Plasma Process Analysis to Significantly Reduce Process Variability
7/8/04 INFICON Wins Top Product Innovation Award
6/25/04 Solid State Technology Features INFICON - The Changing Art of Measuring Vacuum Pressure
4/23/04 Stiletto Wins Semiconductor International 2004 Editors' Choice Best Product Award
4/23/04 FabGuard is Grand Winner of Semiconductor International 2004 Editors' Choice Best Product Award
4/12/04 INFICON Wins Patent for New Method to Control Critical Dimension Error
11/19/03 INFICON Receives $1.1 Million in Follow-on Orders from Samsung Electronics
7/9/03 INFICON Introduces New TripleGauge for Semiconductor and Industrial Coating Applications
7/9/03 INFICON Introduces New Thin Film Deposition Controller for OLED Applications at SEMICON West 2003
6/25/03 INFICON Announces Expansion of Combination Vacuum Gauge Line with TripleGauge for Semiconductor and Industrial Coating Applications
6/23/03 INFICON Unveils UL5000 Helium Leak Detector at SEMICON West 2003
6/23/03 INFICON to Introduce Thin Film Deposition Controller for Maximum Throughput in OLED Applications at SEMICON West
1/30/03 INFICON Receives Orders Valued at $2.6 million from Samsung Electronics
1/7/03 New Vision Systems: Leadership in Mission-Critical Process Control ^SM^
1/7/03 INFICON ACQUIRES NEW VISION SYSTEMS - Company Expands Its Capabilities in the Emerging Advanced Process Control Market -
7/22/02 INFICON Introduces New PCG Vacuum Gauge at SEMICON West 2002, San Francisco - First vacuum gauge to combine CDG and Pirani technologies in one for greater accuracy
6/25/02 INFICON Announces Follow-On Order From Major U.S. Chip Manufacturer
3/18/02 ProMOS Technologies Selects INFICON Fabguard Sensor Integration And Analysis System As Part Of Its Advanced Process Control Initiative
12/7/01 INFICON Installs FabGuard Sensor Integration and Analysis System At Major Semiconductor Manufacturer
10/25/01 INFICON FabGuard Sensor Integration and Analysis System Used by International SEMATECH; FabGuard Qualifies Performance of 300mm Wafer Manufacturing Equipment
10/5/01 INFICON FabGuard Sensor Integration and Analysis System Installed At Major U.S. Chip Manufacturer
8/23/01 INFICON Receives Order From Samsung for Its FabGuard Sensor Integration and Analysis System
7/12/01 INFICON Introduces First Multi-Sensor e-Diagnostics For Semiconductor Manufacturing At SEMICON West 2001
7/11/01 INFICON Introduces Capacitance Diaphragm Gauge For High-Temperature Processes
12/6/00 New Cart For Mobile Troubleshooting
12/6/00 New Pumping Packages Extend Sampling Range
6/14/00 New FabGuard Integrates and Analyzes Process Data to Maximize Productivity
6/5/00 Vacuum Gauge Offers More Consistent Pressure Measurement